TMS Divisions:

Test & Measurement Embedded Systems   Distribution

Upcoming Events 

To view previous Webinars, please visit our Application Notes & Videos Page

 

Compass 2017


When: October 18-20, 2017

Where: Half Moon Bay, CA


REGISTER HERE

COMPASS 2017 Preliminary Program Agenda Available!

 

Our fifth users’ conference, COMPASS 2017 offers another great lineup of thought-provoking topics presented by industry experts. Don't miss this unique opportunity to be a part of in-depth technical sessions on the latest advancements in test and measurement technologies, and to learn about best practices using FormFactor and Cascade Microtech products and emerging applications including: 
 

  • Optoelectronics/Photonics: Columbia University, Keysight Technologies, imec
  • Advanced Testing: T.I.P.S, Infineon, Intel
  • Reliability/Parametric: SCL, SUNY, FormFactor, XFAB
  • RF/mmW Probing: Roos, FormFactor, Karlsruhe Institute of Technology
  • Power Devices: UC Davis, Celadon
  • Production Test: imec, FormFactor, Texas Instruments

 

Ralf Herrtwich, Head of Automotive Business Group for HERE, will kick off COMPASS 2017 with the keynote address“Maps for Cars by Cars.” On the second day, Octavio Martinez, Vice President of Engineering at Qualcomm, will deliver the featured session “Probing and Testing Challenges in the 5G Era.”
 

In addition to over 20 technical sessions, COMPASS 2017 provides excellent networking opportunities to get connected with our speakers, industry peers, as well as our solution partners and our executive management team. Check out the COMPASS 2017 Agenda to learn more and register for this educational forum.

 

EARLY-BIRD REGISTRATION: $200 USD BEFORE AUGUST 25

STANDARD REGISTRATION: $250 USD

 

 

Introduction to boundary-scan - US


When: October 24, 2017

9:00 AM MDT / 11:00 AM EDT


REGISTER HERE

Abstract:
An eye-opener in the world of structural testing.

Many electronics assemblies already include JTAG/boundary-scan test circuitry which is either underused or not used at all. This webinar aims to inform test- and development engineers of the possibilities of this built-in test and device programming feature.

 

 

Design for Test with boundary-scan - US


When: October 26, 2017

9:00 AM MDT / 11:00 AM EDT
 

REGISTER HERE

Abstract:

Determine how ready is your design for boundary-scan? Interactively ask questions!

 

The earlier a fault or a defect is detected in the design phase or during the production process, it will cost less money to remedy it and it will be faster ready for production or shipment. This webinar explains the most important DfT rules.

 

 

JTAG ProVision, inexpensive automated PCB test


When: October 31, 2017

9:00 AM MDT / 11:00 AM EDT

REGISTER HERE

 

Abstract:

JTAG ProVision, the inexpensive PCB methodology in manufacturing, Demonstration with JTAG ProVision on how to do modeling and automatically generate the test/programming applications, explain how this can work for you and save time and money,

 

ProVision combines advanced automation with the level of control and precision that engineers demand when creating test programs and in-system programming (ISP) routines for PLDs, FPGAs, flash memories, serial PROMs and other devices. Learn more about its easy to use features.

 

 

Identifying and Overcoming Noise in Data Acquisition


When: Wednesday, November 1, 2017

11:00 AM Pacific / 2:00 PM Eastern


REGISTER HERE

Abstract:

Have you ever captured noisy data to your PC, having to then use software to "massage" the data to try and yield useful results?

 

By identifying and reducing seven different sources of noise, you’ll increase your measurement accuracy and reliability to obtain your desired results. Join us for a 1-hour webinar and learn the basic sources of electrical noise in data-acquisition systems including power line, aliasing, common mode, and quantization noise. You will learn how to easily identify, isolate, and remove these noise sources to ensure measurement data is accurate and reliable.

 

The seven noise sources covered in this webinar include:

 

  • Quantization noise

  • A/D internal noise

  • Power line noise

  • Time Skew

  • Aliasing noise

  • Common mode noise

  • Radiated noise (EMI)

 

Presented by Richard Patterson, Yokogawa Product Manager. Richard Patterson has 12 years of industry experience in measurement, automation, test, and data acquisition. He completed his M.S. in Physics at The Ohio State University in 2004.

 

 

Easy Data Center Testing up to 100Gbps


When: Available On Demand

Duration: 19 minutes


REGISTER HERE

Abstract:
Increased copper & fiber optic cabling within Data Centers drive client installation and verification demands.  Data Center Operations struggle to install, verify and troubleshoot client connections and Data Center Interconnects deployed daily in expanding data centers that require a hand-held, all-in-one tool for testing and troubleshooting at all data rates, using any given interface, located anywhere in the data center. 

 

This brief presentation describes the capabilities and ease of use of the Anritsu MT1x00A Network Master Series for copper and fiber cable testing and verification in one-step.

 
 

Presented by Danny Gonzalez - Optical Transport Business Development Manager at Anritsu Company. Daniel Gonzalez possesses over 16 years’ experience in digital and optical transport testing, development, training and execution spanning technologies including TDM, SONET, OTN, ATM, Carrier Ethernet and Physical Layer Signal Integrity.

 

As an Optical Transport Business Development Manager for Anritsu Company, Daniel is responsible for providing technical support to sales, marketing & customers in North & South America. Daniel holds a B. S. in Telecommunications Management from DeVry University,          is a member of OIF (Optical Internetworking Forum) Networking & Operations Working Group (WG), member of IEEE Communications Society (ComSoc) & has his MEF (Metro Ethernet Forum) Carrier Ethernet 2.0 Professional Certification. He also has several of his articles published in Lightwave, ISE Magazine, Mission Critical and Pipeline publications.