TMS Divisions:

Test & Measurement Embedded Systems   Distribution

Upcoming Events 

To view previous Webinars, please visit our Application Notes & Videos Page

 

Introduction to boundary-scan - US



When: Thu, August 17, 2017

Time: 11:00 AM EST


REGISTER HERE

Abstract:
An eye-opener in the world of structural testing
 
 

 

 

Design for Test with boundary-scan - US



When: Thu, August 24, 2017

Time: 11:00 AM EST


REGISTER HERE

Abstract:
Determine how ready is your design for boundary-scan? Interactively ask questions!
 
 

 

 

 


When: Tue, August 30, 2017

Time: 1:00 PM EDT | 10:00 AM PDT

REGISTER HERE

(Interested, but can't make the date? Register now and we'll send you a link to
the full webinar after the event so you can view it at anytime)

 

 

Join us for these learning objectives:

  • Discover why the right platform can save time to integrate, simplify integration, and ensure accurate testing.

  • Understand the differences in switching platforms.

  • Gain insight from a company with almost 30 years of modular signal switching and simulation experience in electronic test and verification.

 

  PRESENTER 
Keith Moore
Founder & CEO
Pickering Interfaces

 

 Began at Pickering Electronics, a Reed Relay manufacturer in 1982.

 Started Pickering Interfaces in 1985.

 In 1988, introduced their first modular GPIB 3U switching system. Pickering Interfaces now offers the largest range of switching and simulation solutions in the industry for PXI, LXI, and PCI applications.  

 Holds a BSc in Physics with Electronics from the University of Southampton.

 

  PRESENTER 
Bob Stasonis
Director of Sales & Marketing
Pickering Interfaces

 A market innovator in signal switching and conditioning for a broad range of applications and industries.
 Has contributed to and written numerous papers and articles on the subject of Electronic Test.
 Held previous Technical, Sales & Marketing positions with Teradyne, GenRad, and Schlumberger.
 A member of the Board of Directors and past President of the PXI Systems Alliance, Board Member of the LXI Consortium, and past VP of Marketing for the American Society of Test Engineers.

 

MODERATOR 
Rick Nelson
Executive Editor
Evaluation Engineering

 

 

Power Integrity, Digital Power Management and
Power Sequencing Analysis



When: Wed, September 6, 2017

Time: 10:00 AM PDT | 1:00 PM EDT


REGISTER HERE

Abstract:
Multi-phase digital power management ICs (PMICs) present unique testing challenges, especially in terms of understanding transient load response and load/current sharing/tracking.

The recent advent of high bandwidth and high channel count oscilloscopes with high definition (12-bits) has provided new capabilities for analyzing PMIC operation at the IC validation stage and also as designed into an embedded system when more than one DC power rail / PMIC operation needs to be analyzed simultaneously, or for specific single-rail power integrity studies.  

Join Teledyne LeCroy for an overview of digital power management, power integrity, and power sequencing. We'll discuss test of single or multi-phase digital power management ICs (PMICs), voltage regulator modules (VRMs), point-of-load (POLs) switching regulators, low-dropout (LDO) regulators or other DC-DC converter operations under transient load conditions, and test of complete embedded systems that contain these devices. 
 
 

Presented by Ken Johnson, Director of Marketing, Product Architect

 

 

Compass 2017


When: October 18-20, 2017

Where: Half Moon Bay, CA


REGISTER HERE

COMPASS 2017 Preliminary Program Agenda Available!

 

Our fifth users’ conference, COMPASS 2017 offers another great lineup of thought-provoking topics presented by industry experts. Don't miss this unique opportunity to be a part of in-depth technical sessions on the latest advancements in test and measurement technologies, and to learn about best practices using FormFactor and Cascade Microtech products and emerging applications including: 
 

  • Optoelectronics/Photonics: Columbia University, Keysight Technologies, imec
  • Advanced Testing: T.I.P.S, Infineon, Intel
  • Reliability/Parametric: SCL, SUNY, FormFactor, XFAB
  • RF/mmW Probing: Roos, FormFactor, Karlsruhe Institute of Technology
  • Power Devices: UC Davis, Celadon
  • Production Test: imec, FormFactor, Texas Instruments

 

Ralf Herrtwich, Head of Automotive Business Group for HERE, will kick off COMPASS 2017 with the keynote address“Maps for Cars by Cars.” On the second day, Octavio Martinez, Vice President of Engineering at Qualcomm, will deliver the featured session “Probing and Testing Challenges in the 5G Era.”
 

In addition to over 20 technical sessions, COMPASS 2017 provides excellent networking opportunities to get connected with our speakers, industry peers, as well as our solution partners and our executive management team. Check out the COMPASS 2017 Agenda to learn more and register for this educational forum.

 

EARLY-BIRD REGISTRATION: $200 USD BEFORE AUGUST 25

STANDARD REGISTRATION: $250 USD

 

 

 

Easy Data Center Testing up to 100Gbps


When: Available On Demand

Duration: 19 minutes


REGISTER HERE

Abstract:
Increased copper & fiber optic cabling within Data Centers drive client installation and verification demands.  Data Center Operations struggle to install, verify and troubleshoot client connections and Data Center Interconnects deployed daily in expanding data centers that require a hand-held, all-in-one tool for testing and troubleshooting at all data rates, using any given interface, located anywhere in the data center. 

 

This brief presentation describes the capabilities and ease of use of the Anritsu MT1x00A Network Master Series for copper and fiber cable testing and verification in one-step.

 
 

Presented by Danny Gonzalez - Optical Transport Business Development Manager at Anritsu Company. Daniel Gonzalez possesses over 16 years’ experience in digital and optical transport testing, development, training and execution spanning technologies including TDM, SONET, OTN, ATM, Carrier Ethernet and Physical Layer Signal Integrity.

 

As an Optical Transport Business Development Manager for Anritsu Company, Daniel is responsible for providing technical support to sales, marketing & customers in North & South America. Daniel holds a B. S. in Telecommunications Management from DeVry University,          is a member of OIF (Optical Internetworking Forum) Networking & Operations Working Group (WG), member of IEEE Communications Society (ComSoc) & has his MEF (Metro Ethernet Forum) Carrier Ethernet 2.0 Professional Certification. He also has several of his articles published in Lightwave, ISE Magazine, Mission Critical and Pipeline publications.