

| January 2007 | EvaluationEngineering.com |
EE Readers Select 2006’s Best Products

Thank you to our many readers who took time from their busy schedules to select the best products published in EE during 2006. For the 12th consecutive year, we asked our readers to vote for the most outstanding from among the many products introduced to the test and measurement market by a number of equipment manufacturers.
The selection process began by compiling a group of products representing ATE, Communications Test, Data Acquisition, Environmental Test, Instrumentation, PC Test, and Software. These determinations were based on the number of responses that each product received during the year through EE’s RSLeads program.
Communications
Test: Capturing the honors in Communications Test is
Yokogawa Corp. of America with the DL7400 Series.
These signal analyzers perform protocol analysis
and waveform observation for FlexRay control
networks and show the correlated results on the
same screen. A FlexRay network transmits and
receives data at 10 Mb/s, 10× faster than a
conventional CAN, and features high levels of
reliability in data transmission. The series comes
with a function that allows a trigger to be set at
a point on a FlexRay signal alone or in
combination with other signal types as well as
when communications failures occur.
PC
Test: Repeating winners is the theme of this year’s
awards as Yokogawa Corp. of America captured a
second honor, this time in PC Test. The busXplorer
USB 2.0 Compliance Test Solution consists of a USB
test fixture and USB compliance test software that
work together with a DL9200 Digital Oscilloscope
controlled by a PC via Ethernet. It performs
high-speed device, host, and hub electrical tests
and legacy low- and full-speed tests as defined by
the USB Implementers Forum. The software provides
step-by-step instructions for completing
compliance tests and when, linked with the
company’s Xviewer Waveform Analysis software, can
organize test results by creating and
automatically naming a report for every test of
each device.