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Boundary-scan Review
A newsletter brought to you by JTAG Technologies - April 2009
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CONTENTS
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DDR-2 Testing
now direct from ProVision models
The vexed question of how to test connection to DDR-2 (Dynamic Data Rate) asynchronous memories is now solved with the latest ProVision models from JTAG Technologies. Previously possible, but only via a pain-staking approach that utilised our old MCD modelling system, new models available for download now, mean that DDR2 RAM tests can be generated with the push of a button. Service Packs for CD14 available
In our continued efforts to get most of the boundary-scan
technology the latest product update of ProVision Software now
available. For existing customers with valid maintenance
contracts, service pack 2 with product improvements and bug
fixes is available for
download on our website free of charge.
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Clue Corner
Connection wizard for loop-back tests
 The
Board Connection plug-in, which is a standard feature in JTAG
ProVision was initially intended as a quick and intuitive method
for assigning pin to pin connections when testing two or more
boards or MCMs as part of a project. However did you know it can also be used effectively in other scenarios where netlist changes need to be made? For example, when use of external DIOS is not practical for testing edge connectors, a loop-back cable can be made to connect single of differential outputs back to corresponding inputs. To inform ProVision of this amendment simply assign these connections in the Board Connections editor and generate a standard interconnect test - Voila! |
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8 SPROMs
Programmed in one go
We just got news from our FAE in Florida that he has devised a customer application that will actually program eight serial PROM devices in one fell swoop. By working closely with our longstanding customer he was able to construct some custom APL applications that could handle eight identical SPROM in one programming action – this in turn lead to a four-fold increase in overall programming speed and one happy customer. Let us know if you need to know more about how he did this or indeed if you can beat this record. |
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Best in
test award again to JTAG Technologies
 After
winning the award in 2007 and a finalist in 2008 we are very
pleased to announce that we are once again a BiT winner for the
JTAG Technologies
JT37x7 Rack – Mountable – Instrument.
It is great to receive this recognition for yet another
boundary-scan innovation.
The JT 37x7 RMI Rack-Mountable Instrument is a complete boundary-scan controller/ tester/ programmer packaged in a standard 19-inch, 1U form factor. It supports all boundary-scan test applications, including IEEE 1149.6 advanced digital network testing, as well as in-system programming of flash memories and programmable logic devices. |
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Training JTAG Technologies’ training classes help to assure that you're making full use of the boundary-scan technology and realizing its benefits. Courses cover the full range-from the basics of the technology on up to advanced topics such as board-level and system-level DFT, use of I/O modules for enhanced test coverage, and integrating boundary-scan into other types of test systems. In fact, we'll tailor a course specific to your enterprise and needs – just contact us to discuss your precise requirements.
Next training:
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